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1

Processor-level reliability simulator for time-dependent gate dielectric breakdown

Chen, Chang-Chih, Liu, Taizhi, Cha, Soonyoung, Milor, Linda

Journal:

Microprocessors and Microsystems

Year:

2015

Language:

english

File:

PDF, 5.06 MB

english, 2015

2

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - System-level modeling of microprocessor reliability degradation due to BTI and HCI

Chen, Chang-Chih, Soonyoung Cha,, Taizhi Liu,, Milor, Linda

Year:

2014

Language:

english

File:

PDF, 2.22 MB

english, 2014

3

Comprehensive reliability and aging analysis on SRAMs within microprocessor systems

Liu, Taizhi, Chen, Chang-Chih, Kim, Woongrae, Milor, Linda

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 1.91 MB

english, 2015

4

System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown

Liu, Taizhi, Chen, Chang-Chih, Cha, Soonyoung, Milor, Linda

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 1.02 MB

english, 2015

5

The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system

Cha, Soonyoung, Kim, Dae-Hyun, Liu, Taizhi, Milor, Linda S.

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 2.95 MB

english, 2015

6

Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements

Cha, Soonyoung, Liu, Taizhi, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2017

Language:

english

File:

PDF, 4.07 MB

english, 2017

7

[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Year:

2018

Language:

english

File:

PDF, 741 KB

english, 2018

8

[IEEE 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Otranto, Italy (2019.6.13-2019.6.14)] 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor

Zhang, Rui, Yang, Kexin, Liu, Taizhi, Milor, Linda

Year:

2019

Language:

english

File:

PDF, 1.37 MB

english, 2019

9

SRAM Stability Analysis and PerformanceâReliability Tradeoff for Different Cache Configurations

Zhang, Rui, Liu, Taizhi, Yang, Kexin, Chen, Chang-Chih, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2020

File:

PDF, 2.33 MB

2020

10

[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Inverse Design of FinFET SRAM Cells

Zhang, Rui, Liu, Zhaocheng, Yang, Kexin, Liu, Taizhi, Cai, Wenshan, Milor, Linda

Year:

2020

File:

PDF, 799 KB

2020

11

Synthesis and electrochemical characterization of Sr2Fe1.5Mo0.5O6–Sm0.2Ce0.8O1.9 composite cathode for intermediate-temperature solid oxide fuel cells

Dai, Ningning, Lou, Zhongliang, Wang, Zhenhua, Liu, Xiaoxi, Yan, Yiming, Qiao, Jinshuo, Jiang, Taizhi, Sun, Kening

Journal:

Journal of Power Sources

Year:

2013

Language:

english

File:

PDF, 1.68 MB

english, 2013

12

An improved direct current sintering technique for proton conductor – BaZr0.1Ce0.7Y0.1Yb0.1O3: The effect of direct current on sintering process

Jiang, Taizhi, Liu, Yajie, Wang, Zhenhua, Sun, Wang, Qiao, Jinshuo, Sun, Kening

Journal:

Journal of Power Sources

Year:

2014

Language:

english

File:

PDF, 1.35 MB

english, 2014

13

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements

Cha, Soonyoung, Chen, Chang-Chih, Liu, Taizhi, Milor, Linda S.

Year:

2014

Language:

english

File:

PDF, 1.87 MB

english, 2014

14

[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - Analysis and architecture design of block matching in BM3D image denoising

Chen, Hongming, Liu, Wenjiang, Liu, Taizhi, Cheng, Yuhua

Year:

2011

Language:

english

File:

PDF, 164 KB

english, 2011

15

Understanding the Flash Sintering of Rare-Earth-Doped Ceria for Solid Oxide Fuel Cell

Jiang, Taizhi, Wang, Zhenhua, Zhang, Jing, Hao, Xiaoming, Rooney, David, Liu, Yajie, Sun, Wang, Qiao, Jinshuo, Sun, Kening, Hay, R.

Journal:

Journal of the American Ceramic Society

Year:

2015

Language:

english

File:

PDF, 1.18 MB

english, 2015

16

The multiparty coherent channel and its implementation with linear optics

He, Guangqiang, Liu, Taizhi, Tao, Xin

Journal:

Year:

2013

Language:

english

File:

PDF, 839 KB

english, 2013

17

[IEEE 2015 16th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2015.3.2-2015.3.4)] Sixteenth International Symposium on Quality Electronic Design - Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines

Liu, Taizhi, Chen, Chang-Chih, Milor, Linda

Year:

2015

Language:

english

File:

PDF, 333 KB

english, 2015

18

System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection

Chen, Chang-Chih, Liu, Taizhi, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2016

Language:

english

File:

PDF, 4.92 MB

english, 2016

19

[IEEE 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI) - Gallipoli (2015.6.18-2015.6.19)] 2015 6th International Workshop on Advances in Sensors and Interfaces (IWASI) - Estimation of remaining life using embedded SRAM for wearout parameter extraction

Woongrae Kim,, Chang-Chih Chen,, Taizhi Liu,, Soonyoung Cha,, Milor, Linda

Year:

2015

Language:

english

File:

PDF, 628 KB

english, 2015

20

Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors

Liu, Taizhi, Chen, Chang-Chih, Milor, Linda

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2016

Language:

english

File:

PDF, 1.35 MB

english, 2016

21

[IEEE 2016 IEEE 34th International Conference on Computer Design (ICCD) - Scottsdale, AZ, USA (2016.10.2-2016.10.5)] 2016 IEEE 34th International Conference on Computer Design (ICCD) - SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection

Liu, Taizhi, Chen, Chang-Chih, Wu, Jiadong, Milor, Linda

Year:

2016

Language:

english

File:

PDF, 531 KB

english, 2016

22

[IEEE 2016 Conference on Design of Circuits and Integrated Systems (DCIS) - Granada, Spain (2016.11.23-2016.11.25)] 2016 Conference on Design of Circuits and Integrated Systems (DCIS) - Design for reliability: A duty-cycle management system for timing violations

Cha, Soonyoung, Kim, Dae-Hyun, Liu, Taizhi, Milor, Linda

Year:

2016

Language:

english

File:

PDF, 758 KB

english, 2016

23

[IEEE 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Barcelona, Spain (2017.11.22-2017.11.24)] 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Modeling for SRAM reliability degradation due to gate oxide breakdown with a compact current model

Zhang, Rui, Liu, Taizhi, Yang, Kexin, Milor, Linda

Year:

2017

Language:

english

File:

PDF, 414 KB

english, 2017

24

[IEEE 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Barcelona, Spain (2017.11.22-2017.11.24)] 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - A comparison study of time-dependent dielectric breakdown for analog and digital circuit's optimal accelerated test regions

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Year:

2017

Language:

english

File:

PDF, 584 KB

english, 2017

25

Tunable Resonance Coupling in Single Si Nanoparticle-Monolayer WS2 Structures

Lepeshov, Sergey, Wang, Mingsong, Krasnok, Alex, Kotov, Oleg, Zhang, Tianyi, Liu, He, Jiang, Taizhi, Korgel, Brian A., Terrones, Mauricio, Zheng, Yuebing, Alu, Andrea

Journal:

ACS Applied Materials & Interfaces

Year:

2018

Language:

english

File:

PDF, 1.09 MB

english, 2018

26

[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - On-line monitoring of system health using on-chip SRAMs as a wearout sensor

Kim, Woongrae, Liu, Taizhi, Milor, Linda

Year:

2017

Language:

english

File:

PDF, 711 KB

english, 2017

27

[IEEE 2017 IEEE International Integrated Reliability Workshop (IIRW) - Fallen Leaf Lake, CA (2017.10.8-2017.10.12)] 2017 IEEE International Integrated Reliability Workshop (IIRW) - Modeling of the reliability degradation of a FinFET-based SRAM due to bias temperature instability, hot carrier injection, and gate oxide breakdown

Zhang, Rui, Liu, Taizhi, Yang, Kexin, Milor, Linda

Year:

2017

Language:

english

File:

PDF, 878 KB

english, 2017

28

[IEEE 2017 IEEE International Integrated Reliability Workshop (IIRW) - Fallen Leaf Lake, CA (2017.10.8-2017.10.12)] 2017 IEEE International Integrated Reliability Workshop (IIRW) - A lifetime and power sensitive design optimization framework for a radio frequency circuit

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Year:

2017

Language:

english

File:

PDF, 770 KB

english, 2017

29

A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2018

File:

PDF, 4.98 MB

2018

30

A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2018

Language:

english

File:

PDF, 4.98 MB

english, 2018

31

[IEEE 2018 Conference on Design of Circuits and Integrated Systems (DCIS) - Lyon, France (2018.11.14-2018.11.16)] 2018 Conference on Design of Circuits and Integrated Systems (DCIS) - Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms

Zhang, Rui, Yang, Kexin, Liu, Taizhi, Milor, Linda

Year:

2018

Language:

english

File:

PDF, 1.60 MB

english, 2018

32

[IEEE 2018 International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2018.10.7-2018.10.11)] 2018 International Integrated Reliability Workshop (IIRW) - New Electromigration Model and Its Potential Application on Degradation Simulation for FinFET SRAM

Zhang, Rui, Yang, Kexin, Liu, Taizhi, Milor, Linda

Year:

2018

File:

PDF, 177 KB

2018

33

Impact of front-end wearout mechanisms on FinFET SRAM soft error rate

Zhang, Rui, Liu, Zhaocheng, Yang, Kexin, Liu, Taizhi, Cai, Wenshan, Milor, Linda

Journal:

Microelectronics Reliability

Year:

2019

Language:

english

File:

PDF, 5.45 MB

english, 2019

34

A library based on deep neural networks for modeling the degradation of FinFET SRAM performance metrics due to aging

Zhang, Rui, Liu, Zhaocheng, Yang, Kexin, Liu, Taizhi, Cai, Wenshan, Milor, Linda

Journal:

Microelectronics Reliability

Year:

2019

Language:

english

File:

PDF, 6.77 MB

english, 2019

35

Optical nanomanipulation on solid substrates via optothermally-gated photon nudging

Li, Jingang, Liu, Yaoran, Lin, Linhan, Wang, Mingsong, Jiang, Taizhi, Guo, Jianhe, Ding, Hongru, Kollipara, Pavana Siddhartha, Inoue, Yuji, Fan, Donglei, Korgel, Brian A., Zheng, Yuebing

Journal:

Nature Communications

Year:

2019

File:

PDF, 2.30 MB

2019

36

Opto-thermoelectric pulling of light-absorbing particles

Lin, Linhan, Kollipara, Pavana Siddhartha, Kotnala, Abhay, Jiang, Taizhi, Liu, Yaoran, Peng, Xiaolei, Korgel, Brian A., Zheng, Yuebing

Journal:

Light: Science & Applications

Year:

2020

File:

PDF, 2.69 MB

2020